Summer party 2024
A summer party for the whole family: laughing, playing and celebrating together. For everyone who makes our company's success possible. A day full of fun and unforgettable moments!
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Women and tech. This is how it works at OWIS!
It's no secret that we have a passion for high-precision products. So it's all the better when we can share this passion with others. We had a great opportunity to do so. Five interested girls visited us on Girls' Day and we showed them how we develop and manufacture these high-precision products, namely beam guidance and micropositioning systems, here in Staufen.
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Dr. Dominik Zimmermann becomes authorized signatory and Chief Business Development Officer (CBDO)
With effect from February 1, 2024, Dr. Dominik Zimmermann has been granted power of attorney and appointed Chief Business Development Officer (CBDO). In his new role, Zimmermann will continue to be responsible for the OWIS Engineering division and, together with the OWIS management team led by Managing Director Rüdiger Ruh, will drive the company's further development.
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Upcoming Events
LASER Worl of PHOTONICS China
March 11 – 13, 2025
New International Expo Centre
Shanghai - China
Hall N5, Booth: 5106
Represented by:
PulsePower Technologiy, Ltd.
Mittweidaer Laser Users' Meeting
June 18 - 19, .2025
University Mittweida (Germany)
Technikumplatz 17
XIV Congreso Nacional del Color
OptoEL Workshop
Juli 2 – 4, 2025
Terrassa - Spain
Represented by:
Pro-Lite Technology Iberia S.L.
Application Reports
OWIS positioning systems in digital-holographic 3D measurement technology
The digital-holographic 3D measurement technology enables fast and at the same time highly precise measurement of the workpiece surface. To position the workpieces, Fraunhofer Institute for Physical Measurement Techniques IPM uses two LINPOS linear stages with direct drive.
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Large area 3D surface inspection with white light interferometry
For the Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH, who are active in optical metrology, we have developed a customer-specific gantry system. This system enables a precise and accurate approach of individual measuring points as well as scanning of the entire surface in a working space of 1,250 mm x 550 mm x 45 mm.
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Setup for the determination of atomic distances
At the TU Berlin, Prof. Dr. Birgit Kanngiesser‘s “Analytical X-ray Physics“ group succeeded in developing a method that efficiently uses the light of an X-ray tube and directs it to a detector with little loss of brilliance. This allows measurements for the determination of atomic distances to be carried out even in smaller Caboratories. OWIS positioning systems simplify the handling decisively.
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Solid phase fluoro spectrometer
The fluorescence spectroscopy uses fluorescence phenomena for the analysis of substances. It differs from several other spectroscopies as it measures the emission instead of the absorption of fluorescent radiation. The research institute „wfk – Cleaning Technology Institute e.V.“ in Krefeld, Germany, for example examines dirt on fabric surfaces in order to identify fluorescent-marked bacteria. This procedure is used for the evaluation of a successful hygiene of a washing process.
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Line laser alignment
A perfectly aligned line laser shall project a homogeneous line. The laser manufacturers are facing various challenges such as straightness of the line, a homogeneous distribution of intensity as well as the orientation of the line in regards to the housing. In order to achieve the goal of a homogeneous line, an anamorphic refractive optic needs to be aligned precisely to a collimated beam of a laser module.
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The FXE instrument
Femtosecond spectroscopy with X-rays is one of the tasks of the European XFEL, the 3.4 km long X-ray laser located in the Hamburg area. The FXE Group (Femtosecond X-Ray Experiments) carries out time-resolved studies on the dynamics of solid objects, fluids and gases. For this purpose, an X-ray emissions spectrometer was installed, which combines 16 single diffraction crystals.
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Measurement of samples
In our example from metrology and analytics, hundreds of samples shall be analysed as fast as possible. In this application, not the lateral traverse speed but the process time is the main cost factor. Due to the sum of the vertical tolerances of all components, an individual refocusing of the camera is required. In order to avoid this time-consuming refocusing, our positioning units are being manufactured, assembled and measured for maximum flatness. Due to this high precision of only a few micrometres, in many applications the refocusing can be dispensed completely.
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