News and Events

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LINPOS in digital-holographic 3D measurement technology

We are pretty proud! With our latest product group, we were able to contribute to the realization of another groundbreaking idea. In the latest application example from digital-holographic 3D measurement technology, we show what our direct-drive linear stages LINPOS can do. Rüdiger Ruh and Dr. Peter Hilgers were impressed by the optical 3D measuring stand developed by Fraunhofer IPM for the automated execution of customer-specific measuring tasks during an on-site project meeting.

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This is how we are driving progress – get to know us at W3+ in Jena

At OWIS, we turn our customers' groundbreaking ideas into reality and drive progress in high-tech industries. In doing so, we rely on our high-quality standard components, our outstanding engineering expertise and our ambition to push technological boundaries. Visit us on September 25/26, 2024 at the W3+ in Jena, Germany. The networking trade fair brings together the photonics, optics, electronics and mechanics sectors. Of course, we from OWIS will be there!

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Stadtradeln 2024

Avoid almost 1,000 kg of CO2 in 21 days? It's easy: we tackled our journeys on two wheels instead of four and counted our kilometres. Thanks to STADTRADELN for this great campaign. Find out how many kilometres you have to cycle to save that much CO2 and also discover what else we have achieved!

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Upcoming Events

Mittweidaer Laser Users' Meeting

June 18 - 19, .2025
University Mittweida (Germany)
Technikumplatz 17

SPIE Photonics West Exhibition 2025

January 28 – 30, 2025
The Moscone Center
San Francisco (USA)

Booth: 4635

Represented by:
OWIS GmbH (Germany) and Pacific Laser Equipment (USA)

Application Reports

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OWIS positioning systems in digital-holographic 3D measurement technology

The digital-holographic 3D measurement technology enables fast and at the same time highly precise measurement of the workpiece surface. To position the workpieces, Fraunhofer Institute for Physical Measurement Techniques IPM uses two LINPOS linear stages with direct drive.

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Large area 3D surface inspection with white light interferometry

For the Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH, who are active in optical metrology, we have developed a customer-specific gantry system. This system enables a precise and accurate approach of individual measuring points as well as scanning of the entire surface in a working space of 1,250 mm x 550 mm x 45 mm.

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Setup for the determination of atomic distances

At the TU Berlin, Prof. Dr. Birgit Kanngiesser‘s “Analytical X-ray Physics“ group succeeded in developing a method that efficiently uses the light of an X-ray tube and directs it to a detector with little loss of brilliance. This allows measurements for the determination of atomic distances to be carried out even in smaller Caboratories. OWIS positioning systems simplify the handling decisively.

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Solid phase fluoro spectrometer

The fluorescence spectroscopy uses fluorescence phenomena for the analysis of substances. It differs from several other spectroscopies as it measures the emission instead of the absorption of fluorescent radiation. The research institute „wfk – Cleaning Technology Institute e.V.“ in Krefeld, Germany, for example examines dirt on fabric surfaces in order to identify fluorescent-marked bacteria. This procedure is used for the evaluation of a successful hygiene of a washing process.

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Line laser alignment

A perfectly aligned line laser shall project a homogeneous line. The laser manufacturers are facing various challenges such as straightness of the line, a homogeneous distribution of intensity as well as the orientation of the line in regards to the housing. In order to achieve the goal of a homogeneous line, an anamorphic refractive optic needs to be aligned precisely to a collimated beam of a laser module.

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The FXE instrument

Femtosecond spectroscopy with X-rays is one of the tasks of the European XFEL, the 3.4 km long X-ray laser located in the Hamburg area. The FXE Group (Femtosecond X-Ray Experiments) carries out time-resolved studies on the dynamics of solid objects, fluids and gases. For this purpose, an X-ray emissions spectrometer was installed, which combines 16 single diffraction crystals.

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Measurement of samples

In our example from metrology and analytics, hundreds of samples shall be analysed as fast as possible. In this application, not the lateral traverse speed but the process time is the main cost factor. Due to the sum of the vertical tolerances of all components, an individual refocusing of the camera is required. In order to avoid this time-consuming refocusing, our positioning units are being manufactured, assembled and measured for maximum flatness. Due to this high precision of only a few micrometres, in many applications the refocusing can be dispensed completely.

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